System and method for measuring the thickness of material layers applied in the funnel of a cathode ray tube during manufacture

Patent Application United States Patent and Trademark Office, Patent Application No. 09873610
Examiner Yaritza Guadalupe, presiding

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David Allen Murtishaw, Sun City, CA, Applicant

Patent Type	Utility
First Named Inventor	David Allen Murtishaw, Sun City, CA, ()
Filing Date	June 4, 2001
Status	Abandoned -- Failure to Respond to an Office Action
Status Date	Unknown
Location	File Repository (franconia)
USPTO Customer Number	Unknown
Attorney Docket Number	08238.019
Confirmation Number	4067
Group Art Unit	2859
Class / Sub-Class	33 / 834

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	Filed: 2/26/2003, Entered: None	Transaction History
	Mail Abandonment for Failure to Respond to Office Action


	Filed: 2/24/2003, Entered: None	Transaction History
	Aband. for Failure to Respond to O. A.


	Filed: 8/21/2002, Entered: None	Transaction History
	Mail Non-Final Rejection


	Filed: 8/19/2002, Entered: None	Transaction History
	Non-Final Rejection


	Filed: 9/2/2001, Entered: None	Transaction History
	Case Docketed to Examiner in GAU


	Filed: 8/2/2001, Entered: None	Transaction History
	Correspondence Address Change


	Filed: 8/2/2001, Entered: None	Transaction History
	Application Dispatched from OIPE


	Filed: 6/12/2001, Entered: None	Transaction History
	IFW Scan & PACR Auto Security Review


	Filed: 6/4/2001, Entered: None	Transaction History
	Initial Exam Team nn

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