Bae, Sang Man

Bae, Sang Man

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	Date Filed	Venue	Case Number	Title	Party Type
	11/30/2004	United States Patent and Trademark Office	10998814	Method For Forming Fine Patterns Of Semiconductor Device	Applicant
	6/30/2004	United States Patent and Trademark Office	10879134	Method For Exposing Photoresist Film Of Semiconductor Device	Applicant
	4/28/2003	United States Patent and Trademark Office	10423871	Photomask And Method For Forming Micro Patterns Of Semicondu...	Applicant
	6/28/2000	United States Patent and Trademark Office	09606462	Photomask And Method For Forming Micro Patterns Of Semicondu...	Applicant
	9/10/1999	United States Patent and Trademark Office	09393868	Repair Method For Phase Shift Mask In Semiconductor Device	Applicant
	11/10/1997	United States Patent and Trademark Office	08966821	Method For Forming Resist Patterns Having Two Photoresist La...	Applicant
	6/26/1997	United States Patent and Trademark Office	08883289	Process For Forming Fine Pattern For Semiconductor Device Ut...	Applicant
	11/22/1996	United States Patent and Trademark Office	08755021	Method For Forming Micro Patterns Of Semiconductor Devices	Applicant
	10/3/1996	United States Patent and Trademark Office	08725177	Method For Inspecting Process Defects Occurring In Semicondu...	Applicant
	9/25/1996	United States Patent and Trademark Office	08719449	Method For Inspecting Process Defects Occurring In Semicondu...	Applicant
	9/18/1996	United States Patent and Trademark Office	08715631	Method For Fabricating Word Lines Of A Semiconductor Device	Applicant
	6/6/1996	United States Patent and Trademark Office	08659741	Process For Forming Fine Patterns In A Semiconductor Device ...	Applicant
	10/11/1995	United States Patent and Trademark Office	08540869	Phase Shift Mask And Method For Fabricating The Same	Applicant
	7/13/1995	United States Patent and Trademark Office	08501947	Method For Forming Resist Patterns Comprising Two Photoresis...	Applicant
	7/13/1995	United States Patent and Trademark Office	08502178	Method For Detecting Wafer Defects	Applicant
	10/14/1994	United States Patent and Trademark Office	08323230	Bipolar Alignment Mark For Semiconductor Device And Process ...	Applicant
	10/12/1994	United States Patent and Trademark Office	08321448	Method For The Preparation Of A Pattern Overlay Accuracy-mea...	Applicant

17 Rows Total

Outside Counsel (288)

	Last Name	First Name	Middle Name	Firm	Location
	Absher	Alton	L.	Kilpatrick Townsend & Stockton, LLP	Winston-salem, Nc,
	Adams	Scott	S.	Kilpatrick Townsend & Stockton, LLP	San Francisco, CA
	Albert	Philip		Union Bank Bldg
	Alemanni	John	C.	Kilpatrick Townsend & Stockton, LLP	Winston-salem, Nc,
	Allen	Kenneth		Steuart St., Tower, One Market Plaza San Fra...	Virginia Beach, VA
	Aly	Amr	O.	Kilpatrick Townsend & Stockton, LLP	Ny 10036,
	Amanat	Houtan		Kilpatrick Townsend & Stockton, LLP
	Annis	David		Sharp Kabushiki Kaisha
	Apple	Randolph	Ted	Kilpatrick Townsend & Stockton, LLP
	Artuz	Robert		Sharp Kabushiki Kaisha
	Atkins	William		Popovich, Wiles & O'connell, PA
	Auchterlonie	Thomas	S.	Harness Dickey & Pierce, PLC	RESTON, VA
	Bailey	Renae	A.	Kilpatrick Townsend & Stockton, LLP	Atlanta, GA
	Bailey	Suzin		Jacobson Holman, PLLC
	Baillie	Iain		uwclub.net Law Firm Placeholder
	Balun	Matthew		Sharp Kabushiki Kaisha
	Bansal	Manu		Pillsbury Winthrop Shaw Pittman LLP
	Barrish	Mark		Sharp Kabushiki Kaisha
	Barufka	Jack		Medtronic Vascular, Inc.	Mclean, VA
	Basarkar	Girish		Sharp Kabushiki Kaisha
	Bastian	Kevin		Sharp Kabushiki Kaisha
	Bedgood	Robert		Popovich, Wiles & O'connell, PA
	Belagodu	Akarsh	P.	Kilpatrick Townsend & Stockton, LLP	Atlanta, GA
	Bell	Emily		Medtronic Vascular, Inc.
	Bennett	Jesse		Lee & Hayes PLLC
	Berg	Richard		THOMAS E. KRISTOFFERSON
	Bergstrom	James		Sharp Kabushiki Kaisha
	Bernard	Eugene		Sharp Kabushiki Kaisha
	Bertelson	Michael		Digeo, Inc.
	Blackburn	Jennifer		Paul Hastings LLP
	Blaise	Bradford		Popovich, Wiles & O'connell, PA
	Blake	Vanessa		Sharp Kabushiki Kaisha
	Blaylock	Richard		Popovich, Wiles & O'connell, PA
	Boring	Landin		Kilpatrick Townsend & Stockton, LLP	Seattle, WA
	Bowers	Carl		Kilpatrick Townsend & Stockton, LLP
	Boyd	David		Sharp Kabushiki Kaisha
	Branch	Catherine		Fish & Richardson, PC
	Britt	Juliene		Kilpatrick Townsend & Stockton, LLP
	Brown	Kyle		Kilpatrick Townsend & Stockton, LLP
	Brown	Theodore		Fay Sharpe LLP
	Bussey	Megan		Sharp Kabushiki Kaisha
	Calkins	Charles		Paul Hastings LLP
	Cassell	Nathan		Sharp Kabushiki Kaisha
	Caswell	Deborah		Hickman Palermo Truong & Becker, LLP
	Catmull	Kelvin		Kilpatrick Townsend & Stockton, LLP
	CHANG	KO-FANG		Kilpatrick Townsend & Stockton, LLP
	Chang	Shin-Tsen		Electronic Arts, Inc.
	Chen	Jiwen		Jacobson Holman, PLLC
	Choi	Wendy		S. MATTHEW CARINS
	Chong	Suet		Brobeck, Phleger & Harrison LLP
	COLLINS	BRYAN			MCLEAN, VA
	Colwell	Robert		DAVID J. THIBODEAU, JR.
	Cook	Roger		Christensen O'Connor Johnson Kindness PLLC
	Cosenza	Martin	J.	Foley & Lardner, LLP	Washington, DC
	Crall	Kristin		Paul Hastings LLP
	Cretsinger	Cathy		Sharp Kabushiki Kaisha
	Curylo	Robert	J.	Kilpatrick Townsend & Stockton, LLP	Atlanta, GA
	Dailey	Robert		Garvey, Smith, Nehrbass & North, LLC
	Daley	William		Lorusso & Loud	Ma,
	DANIELSON	MARK			Palo Alto, CA
	Datta	Madhumita		Pillsbury Winthrop Shaw Pittman LLP
	Dave	Raju		Popovich, Wiles & O'connell, PA
	Davoudian-Moghaddam	Keyvan		Popovich, Wiles & O'connell, PA
	DeConti	Giulio		BRIANA K. O'REGAN	Ma,
	DeMarco	Anthony		Pillsbury Winthrop Shaw Pittman LLP
	Dimino	Michael	J.	JOHNSON, MARCOU & ISAACS, LLC	SAVANNAH, GA
	Dodson	Richard		Kilpatrick Townsend & Stockton, LLP
	Doody	Patrick		Popovich, Wiles & O'connell, PA
	Dorsey	Christopher		Popovich, Wiles & O'connell, PA
	Doyle	Kristin		Sharp Kabushiki Kaisha
	Durkee	Christopher	M.	Kilpatrick Townsend & Stockton, LLP	Atlanta, GA
	Ellenberger	Ernest		Baker Donelson Bearman Caldwell & Berkowitz,...
	Eng	Hugo		Hoffman-La Roche, Inc.
	Esplin	D.		Popovich, Wiles & O'connell, PA
	Eurek	Justin		Kilpatrick Townsend & Stockton, LLP
	Ewing	James	P.	Foley & Lardner, LLP	Boston, MA
	Ferrario	Matias		Paul Hastings LLP
	Finkel	Evan			Los Angeles, CA
	Flanagan	Lisa		Sharp Kabushiki Kaisha
	Foster	Bryan		Sharp Kabushiki Kaisha
	Franklin	Thomas		Sharp Kabushiki Kaisha
	Fuhrer	Robert		Popovich, Wiles & O'connell, PA
	Galloway	Peter		LESTER HORWTZ
	Galloway.	Peter	D.	Ladas & Parry LLP
	Gao	Chuan		Kilpatrick Townsend & Stockton, LLP	San Francisco, CA
	Gardner	Jason		Paul Hastings LLP
	Gardner	John	Steven	Kilpatrick Townsend & Stockton, LLP	WINSTON-SALEM, NC
	Garrett-Wackowski	Euginia		Kilpatrick Townsend & Stockton, LLP
	Gatto	James		Schuyler, Banner, Birch, McKie & Beckett
	Gaudry	Katherine		Sharp Kabushiki Kaisha
	Gavin	Geoffrey	K.	Smith & Nephew, Inc.
	Gee	Tyler		Kilpatrick Townsend & Stockton, LLP
	Ghazanfari	Faryar		Kilpatrick Townsend & Stockton, LLP
	Gibby	Darin		Sharp Kabushiki Kaisha
	Giordano-Coltart	Jennifer		Paul Hastings LLP
	Golladay	James II		Kilpatrick Townsend & Stockton, LLP	Ca,
	Grab	Leslie		Paul Hastings LLP
	Grant	Bonnie		Sharp Kabushiki Kaisha
	Gray	Charles		Qwest Comunications International, Inc.
	Gray	Gerald		Leydig Voit & Mayer, Ltd.

288 Rows Total	Page 1 of 3 | Go To

Bae, Sang Man has not filed any forms with the United States Securities and Exchange Commission.

	Date Recorded	Party	Role	Document Type	Document No.	Invention Title
	5/6/2010	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	11944746 20080241766 7736843	Method For Manufacturing A Semiconductor Device Method For Manufacturing A Semiconductor Device Method For Manufacturing A Semiconductor Device
	7/8/2008	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	12165125 20090108402 7875515	Method For Manufacturing Capacitor Of Semiconductor Device Method For Manufacturing Capacitor Of Semiconductor Device Method For Manufacturing Capacitor Of Semiconductor Device
	7/1/2008	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	12147745 20090286185 8507184	Method Of Manufacturing Semiconductor Device Method of Manufacturing Semiconductor Device Method of Manufacturing Semiconductor Device
	7/5/2006	Hynix Semiconductor Inc.	Assignee	Application Publication	11481638 20070042276	Lithography apparatus and method for using the same Lithography apparatus and method for using the same
	12/29/2005	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	11322289 20060170057 7276410	Semiconductor Device With Omega Gate And Method For Fabricating A Semico... Semiconductor Device With Omega Gate And Method For Fabricating A Semico... Semiconductor Device With Omega Gate And Method For Fabricating A Semico...
	11/10/2005	Hynix Semiconductor Inc.	Assignee	Application Publication	11270464 20060234169	Photo mask Photo mask
	10/26/2005	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	11259960 20060141694 8053312	Semiconductor Device And Method For Fabricating The Same Semiconductor Device And Method For Fabricating The Same Semiconductor Device And Method For Fabricating The Same
	6/24/2005	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	11165179 20060118838 7755149	Photo Mask And Semiconductor Device Fabricated Using The Same Photo Mask And Semiconductor Device Fabricated Using The Same Photo Mask And Semiconductor Device Fabricated Using The Same
	11/30/2004	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	10998814 20050175937 7368226	Method For Forming Fine Patterns Of Semiconductor Device Method For Forming Fine Patterns Of Semiconductor Device Method For Forming Fine Patterns Of Semiconductor Device
	10/15/2004	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	10331386 20040012776 6836322	Particle Inspection Device And Inspection Method Using The Same Particle Inspection Device And Inspection Method Using The Same Particle Inspection Device And Inspection Method Using The Same
	6/30/2004	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	10879134 20050118538 7709186	Method For Exposing Photoresist Film Of Semiconductor Device Method For Exposing Photoresist Film Of Semiconductor Device Method For Exposing Photoresist Film Of Semiconductor Device
	12/24/2003	Hynix Semiconductor Inc.	Assignee	Application Publication Patent	10743715 20040261282 6864590	Alignment Mark For Aligning Wafer Of Semiconductor Device Alignment Mark For Aligning Wafer Of Semiconductor Device Alignment Mark For Aligning Wafer Of Semiconductor Device
	4/28/2003	Hyundai Electronics Industries Company, ...	Assignee	Application Publication Patent	10423871 20030186138 6821690	Photomask And Method For Forming Micro Patterns Of Semiconductor Device ... Photomask And Method For Forming Micro Patterns Of Semiconductor Device ... Photomask And Method For Forming Micro Patterns Of Semiconductor Device ...
	6/28/2000	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	09606462 6569605	Photomask And Method For Forming Micro Patterns Of Semiconductor Device ... Photomask And Method For Forming Micro Patterns Of Semiconductor Device ...
	9/10/1999	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	09393868 6329106	Repair Method For Phase Shift Mask In Semiconductor Device Repair Method For Phase Shift Mask In Semiconductor Device
	12/1/1997	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08880367 5870201	Magnification Measuring Mark Magnification Measuring Mark
	9/19/1997	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08618812 5721074	Method For Fabricating A Light Exposure Mask Comprising The Use Of A Pro... Method For Fabricating A Light Exposure Mask Comprising The Use Of A Pro...
	8/4/1997	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08867457 5776640	Photo Mask For A Process Margin Test And A Method For Performing A Proce... Photo Mask For A Process Margin Test And A Method For Performing A Proce...
	12/27/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08777202 6015650	Method For Forming Micro Patterns Of Semiconductor Devices Method For Forming Micro Patterns Of Semiconductor Devices
	12/13/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08766487 5925578	Method For Forming Fine Patterns Of A Semiconductor Device Method For Forming Fine Patterns Of A Semiconductor Device
	11/22/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08755021 5902493	Method For Forming Micro Patterns Of Semiconductor Devices Method For Forming Micro Patterns Of Semiconductor Devices
	10/3/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08725177 5811223	Method For Inspecting Process Defects Occurring In Semiconductor Devices Method For Inspecting Process Defects Occurring In Semiconductor Devices
	10/3/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08725176 5817445	Method For Inspecting Process Defects Occurring In Semiconductor Devices Method For Inspecting Process Defects Occurring In Semiconductor Devices
	9/26/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08722877 5668042	Method For Aligning Micro Patterns Of A Semiconductor Device Method For Aligning Micro Patterns Of A Semiconductor Device
	9/24/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08719069 5766809	Method For Testing Overlay In A Semiconductor Device Utilizing Inclined ... Method For Testing Overlay In A Semiconductor Device Utilizing Inclined ...
	9/23/1996	Hyundai Electronics Industries Col., Ltd...	Assignee	Application Patent	08719449 5821131	Method For Inspecting Process Defects Occurring In Semiconductor Devices Method For Inspecting Process Defects Occurring In Semiconductor Devices
	9/18/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08715631 5834161	Method For Fabricating Word Lines Of A Semiconductor Device Method For Fabricating Word Lines Of A Semiconductor Device
	8/19/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08501947 5830624	Method For Forming Resist Patterns Comprising Two Photoresist Layers And... Method For Forming Resist Patterns Comprising Two Photoresist Layers And...
	7/22/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08621796 5902701	Phase Shift Mask And Method For Fabricating The Same Phase Shift Mask And Method For Fabricating The Same
	6/28/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08670841 5849438	Phase Shift Mask And Method For Fabricating The Same Phase Shift Mask And Method For Fabricating The Same
	5/21/1996	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08540869 5705300	Phase Shift Mask And Method For Fabricating The Same Phase Shift Mask And Method For Fabricating The Same
	12/15/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08540769 5657790	Valves For Pressurized Containers Valves For Pressurized Containers
	9/15/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08382756 5498449	Photoresist Film Coating Method Photoresist Film Coating Method
	7/13/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08502178 5633173	Method For Detecting Wafer Defects Method For Detecting Wafer Defects
	3/7/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08400045 5598250	Prefabricated Modified Illumination Apparatus For Forming Fine Patterns ... Prefabricated Modified Illumination Apparatus For Forming Fine Patterns ...
	2/6/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08339826 5508133	Photo Mask Photo Mask
	2/3/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08383006 5532114	Method Of Forming A Photoresist Pattern In A Semiconductor Device Method Of Forming A Photoresist Pattern In A Semiconductor Device
	2/3/1995	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08383004 5563009	Photomask For Forming A Micropattern Of A Semiconductor Device Photomask For Forming A Micropattern Of A Semiconductor Device
	12/27/1994	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08364047 5498500	Overlay Measurement Mark And Method Of Measuring An Overlay Error Betwee... Overlay Measurement Mark And Method Of Measuring An Overlay Error Betwee...
	12/12/1994	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08353921 5635335	Method For Fabricating Semiconductor Device Utilizing Dual Photoresist F... Method For Fabricating Semiconductor Device Utilizing Dual Photoresist F...
	12/6/1994	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08321448 5578423	Method For The Preparation Of A Pattern Overlay Accuracy-measuring Mark Method For The Preparation Of A Pattern Overlay Accuracy-measuring Mark
	6/27/1994	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08266173 5571641	A Diffraction Mask For The Fabrication Of Semiconductor Devices A Diffraction Mask For The Fabrication Of Semiconductor Devices
	6/10/1994	Hyundai Electronics Industries Company, ...	Assignee	Application Patent	08258193 5468577	Photomask Having Patterns To Reduce Power Of A Stepper Photomask Having Patterns To Reduce Power Of A Stepper

43 Rows Total

Bae, Sang Man has not been involved in any trademark assignment transactions in the PlainSite database.

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