Hiroi, Takashi
United States
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Outside Counsel (218)
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Christian |
A. |
Hickman Palermo Truong & Becker, LLP |
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David |
T. |
Antonelli, Terry, Stout & Kraus, LLP |
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Absher |
Alton |
L. |
Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Adams |
Scott |
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Davis Wright Tremaine LLP |
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Albert |
Philip |
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Union Bank Bldg |
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Alemanni |
John |
C. |
Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Allen |
Kenneth |
R. |
Kilpatrick Townsend & Stockton, LLP |
Palo Alto, CA |
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Aly |
Amr |
O. |
Kilpatrick Townsend & Stockton, LLP |
Ny 10036, |
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Amanat |
Houtan |
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Kilpatrick Townsend & Stockton, LLP |
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Anagnos |
Larry |
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DAVID J. JOHNS, ESQ. |
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Annis |
David |
C. |
Kilpatrick Townsend & Stockton, LLP |
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Antonelli |
Donald |
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Craig & Burns |
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Antonelli |
Donald |
Ralph |
Antonelli, Terry, Stout & Kraus, LLP |
Washington, DC |
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Apple |
Randolph |
Ted |
Kilpatrick Townsend & Stockton, LLP |
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Artuz |
Robert |
John |
Kilpatrick Townsend & Stockton, LLP |
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Auchterlonie |
Thomas |
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Kilpatrick Townsend & Stockton, LLP |
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Balun |
Matthew |
J. |
Kilpatrick Townsend & Stockton, LLP |
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Barrish |
Mark |
D. |
Kilpatrick Townsend & Stockton, LLP |
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Basarkar |
Girish |
M. |
Kilpatrick Townsend & Stockton, LLP |
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Bastian |
Kevin |
L. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Belagodu |
Akarsh |
P. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Bennett |
Jesse |
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Kilpatrick Townsend & Stockton, LLP |
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Bergstrom |
James |
T. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Bernard |
Eugene |
J. |
Oblon, Spivak, McClelland, Maier & Neustadt,... |
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Bertelson |
Michael |
Allen |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Blackburn |
Jennifer |
L. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Blake |
Vanessa |
M. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Boring |
Landin |
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Kilpatrick Townsend & Stockton, LLP |
Seattle, WA |
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Bowers |
Carl |
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Kilpatrick Townsend & Stockton, LLP |
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Boyd |
David |
W. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Britt |
Juliene |
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Perkins Coie LLP |
SEATTLE, WA |
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Brown |
Kyle |
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Kilpatrick Townsend & Stockton, LLP |
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Brown |
Theodore |
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Kilpatrick Townsend & Stockton, LLP |
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Brundidge |
Carl |
T. |
Antonelli, Terry, Stout & Kraus, LLP |
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Brundidge |
Carl |
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GARY D. FIELDS, ESQ. |
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Bui |
Hung |
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R E BUSHNELL |
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Bui |
Jessica |
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Hoffmann & Baron LLP |
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Bussey |
Megan |
Elizabeth |
Kilpatrick Townsend & Stockton, LLP |
Ny 10036, |
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Calkins |
Charles |
W. |
United States Army Corps of Engineers |
FT. BELVOIR, DC |
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Cassell |
Nathan |
S. |
Kilpatrick Townsend & Stockton, LLP |
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Catmull |
Kelvin |
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Kilpatrick Townsend & Stockton, LLP |
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CHANG |
KO-FANG |
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Kilpatrick Townsend & Stockton, LLP |
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Chang |
Shin-Tsen |
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Electronic Arts, Inc. |
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Choi |
Wendy |
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Kilpatrick Townsend & Stockton, LLP |
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Clark |
Kevin |
Michael |
Kilpatrick Townsend & Stockton, LLP |
San Diego, CA |
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Colwell. |
Robert |
C. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Cook |
Roger |
L. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Cosenza |
Martin II |
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Hauptman Ham, LLP |
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Crall |
Kristin |
Mallatt |
Kilpatrick Townsend & Stockton, LLP |
Palm City, FL |
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Cretsinger |
Cathy |
E. |
Kilpatrick Townsend & Stockton, LLP |
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Crookston |
Matthew |
B. |
Kilpatrick Townsend & Stockton, LLP |
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Curylo |
Robert |
J. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Dailey |
Robert |
S. |
Kilpatrick Townsend & Stockton, LLP |
Washington, DC |
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Daley |
William |
J. |
Merchant & Gould, PC |
Minneapolis, MN |
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Dobson |
Allison |
W. |
Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Dodson |
Richard |
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Kilpatrick Townsend & Stockton, LLP |
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Doyle |
Kristin |
L. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Dresser |
James |
N. |
Antonelli, Terry, Stout & Kraus, LLP |
ARLINGTON, DC |
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Dresser |
James |
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ALAN E. SCHIAVELLI |
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Durkee |
Christopher |
M. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Esq. |
Melvin |
Kraus |
Antonelli, Terry, Stout & Kraus, LLP |
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Eurek |
Justin |
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Kilpatrick Townsend & Stockton, LLP |
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Ewing |
James |
Lindsay |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Ferrario |
Matias |
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Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Flanagan. |
Lisa |
Dornbach |
Kilpatrick Townsend & Stockton, LLP |
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Foster |
Bryan |
Stuart |
Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Franklin |
Thomas |
D. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Gao |
Chuan |
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Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Gardner |
Jason |
Delmon |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Gardner |
John |
Steven |
Kilpatrick Townsend & Stockton, LLP |
WINSTON-SALEM, NC |
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Garrett-Wackowski |
Euginia |
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Kilpatrick Townsend & Stockton, LLP |
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Gaudry |
Katherine |
S. |
Kilpatrick Townsend & Stockton, LLP |
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Gavin |
Geoffrey |
Kirkland |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Gee |
Tyler |
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Kilpatrick Townsend & Stockton, LLP |
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Ghazanfari |
Faryar |
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Kilpatrick Townsend & Stockton, LLP |
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Gibby |
Darin |
J. |
Kilpatrick Townsend & Stockton, LLP |
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Giordano-Coltart |
Jennifer |
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Kilpatrick Townsend & Stockton, LLP |
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Goetz. |
David |
H. |
Kilpatrick Townsend & Stockton, LLP |
SAN FRANCISCO, CA |
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Golladay |
James II |
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Kilpatrick Townsend & Stockton, LLP |
Ca, |
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Grab |
Leslie |
Thomas |
Kilpatrick Townsend & Stockton, LLP |
Winston-salem, Nc, |
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Graham |
Jamie |
L. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Grant |
Bonnie |
Marie |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Gray |
Charles |
W. |
Kilpatrick Townsend & Stockton, LLP |
DENVER, CO |
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Gressler |
Donna |
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Foley & Lardner, LLP |
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Hall |
David |
A. |
Pretty & Schroeder, PC |
Los Angeles, CA |
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Hao |
Joe |
Chao-peng |
Kilpatrick Townsend & Stockton, LLP |
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Harris |
Tywanda |
L. |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Hart |
Catherine |
E. |
Kilpatrick Townsend & Stockton, LLP |
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Haughey |
Paul |
D. |
Kilpatrick Townsend & Stockton, LLP |
San Francisco, CA |
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Heines |
M |
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HARRY A. PACINI |
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Henderson |
Mymy |
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Kilpatrick Townsend & Stockton, LLP |
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Hetzer-egger |
Claudia |
H. |
Kilpatrick Townsend & Stockton, LLP |
San Diego, CA |
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Hinsch. |
Matthew |
E. |
Kilpatrick Townsend & Stockton, LLP |
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Hokamura |
Aaron |
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Kilpatrick Townsend & Stockton, LLP |
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Hollister |
Matthew |
A. |
Kilpatrick Townsend & Stockton, LLP |
DENVER, CO |
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Holloway |
David |
Clayton |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Holmes |
Brenda |
Ozaki |
Kilpatrick Townsend & Stockton, LLP |
Atlanta, GA |
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Holt |
Benjamin |
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Kilpatrick Townsend & Stockton, LLP |
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Hopkins |
Mark |
H. |
Kilpatrick Townsend & Stockton, LLP |
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Howard |
James |
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Kilpatrick Townsend & Stockton, LLP |
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6/30/2021 |
Hitachi High-tech Corporation |
Assignee |
Application Publication |
17419581 20220084856 |
Defect Inspection Apparatus and Defect Inspection Program Defect Inspection Apparatus and Defect Inspection Program |
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6/30/2021 |
Hitachi High-tech Corporation |
Assignee |
Application Publication Patent |
17419581 20220084856 12112963 |
Defect Inspection Apparatus and Defect Inspection Program Defect Inspection Apparatus and Defect Inspection Program Defect Inspection Apparatus and Defect Inspection Program |
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4/15/2021 |
Hitachi High-tech Corporation |
Assignee |
Application Publication |
17285537 20210381989 |
Defect Inspection Device and Defect Inspection Method Defect Inspection Device and Defect Inspection Method |
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4/15/2021 |
Hitachi High-tech Corporation |
Assignee |
Application Publication Patent |
17285537 20210381989 11788973 |
Defect Inspection Device and Defect Inspection Method Defect Inspection Device and Defect Inspection Method Defect Inspection Device and Defect Inspection Method |
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11/13/2018 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
16099654 20190154593 |
Inspection Information Generation Device, Inspection Information Generat... Inspection Information Generation Device, Inspection Information Generat... |
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4/6/2015 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
14433698 20150228063 |
Pattern Inspecting and Measuring Device and Program Pattern Inspecting and Measuring Device and Program |
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4/6/2015 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
14433698 20150228063 9858659 |
Pattern Inspecting and Measuring Device and Program Pattern Inspecting and Measuring Device and Program Pattern Inspecting and Measuring Device and Program |
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11/25/2014 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
14403668 20150212019 9188554 |
Pattern Inspection Device And Pattern Inspection Method Pattern Inspection Device And Pattern Inspection Method Pattern Inspection Device And Pattern Inspection Method |
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7/2/2013 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13978095 20130271595 |
Circuit Pattern Inspecting Device And Inspecting Method Thereof Circuit Pattern Inspecting Device And Inspecting Method Thereof |
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6/6/2013 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13992057 20130248709 |
Defect Inspecting Apparatus Defect Inspecting Apparatus |
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5/30/2013 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
13905164 20130322737 8953868 |
Defect Inspection Method And Defect Inspection Apparatus Defect Inspection Method And Defect Inspection Apparatus Defect Inspection Method And Defect Inspection Apparatus |
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2/1/2013 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
13697025 20130119250 8853628 |
Defect Inspection Method, And Device Thereof Defect Inspection Method, And Device Thereof Defect Inspection Method, And Device Thereof |
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12/7/2012 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13702923 20130082177 |
Circuit Pattern Inspection Apparatus And Circuit Pattern Inspection Meth... Circuit Pattern Inspection Apparatus And Circuit Pattern Inspection Meth... |
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10/18/2012 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
13577719 20120305768 8658987 |
Circuit-Pattern Inspection Device Semiconductor Package And Method Of Fabricating The Same Circuit-Pattern Inspection Device |
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9/25/2012 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13522557 20130010100 |
Image Generating Method And Device Using Scanning Charged Particle Micro... Image Generating Method And Device Using Scanning Charged Particle Micro... |
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10/24/2011 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13266050 20120045115 |
Defect Inspection Device And Defect Inspection Method Defect Inspection Device And Defect Inspection Method |
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4/20/2011 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
13057782 20110188735 |
Method And Device For Defect Inspection Method And Device For Defect Inspection |
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2/25/2011 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
13061031 20110163230 8421010 |
Charged Particle Beam Device For Scanning A Sample Using A Charged Parti... Charged Particle Beam Device For Scanning A Sample Using A Charged Parti... Charged Particle Beam Device For Scanning A Sample Using A Charged Parti... |
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1/26/2011 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
13056046 20110129141 8509516 |
Circuit Pattern Examining Apparatus And Circuit Pattern Examining Method Circuit Pattern Examining Apparatus And Circuit Pattern Examining Method Circuit Pattern Examining Apparatus And Circuit Pattern Examining Method |
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6/8/2009 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
12480443 20090309022 |
Apparatus For Inspecting A Substrate, A Method Of Inspecting A Substrate... Apparatus For Inspecting A Substrate, A Method Of Inspecting A Substrate... |
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2/26/2009 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
12393827 20090226075 8121395 |
Inspection Apparatus And An Inspection Method For Inspecting A Circuit P... Inspection Apparatus And An Inspection Method For Inspecting A Circuit P... Inspection Apparatus And An Inspection Method For Inspecting A Circuit P... |
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10/30/2007 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
11976965 20080099675 |
Inspection apparatus and an inspection method Inspection apparatus and an inspection method |
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8/15/2007 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
11808247 20080067381 7728294 |
Semiconductor Wafer Inspection Tool And Semiconductor Wafer Inspection M... Semiconductor Wafer Inspection Tool And Semiconductor Wafer Inspection M... Semiconductor Wafer Inspection Tool And Semiconductor Wafer Inspection M... |
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5/11/2007 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
11601723 20070194229 7521676 |
Method And Apparatus For Inspecting Pattern Defects And Mirror Electron ... Method And Apparatus For Inspecting Pattern Defects And Mirror Electron ... Method And Apparatus For Inspecting Pattern Defects And Mirror Electron ... |
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12/11/2006 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
11478615 20070069127 7420167 |
Apparatus And Method For Electron Beam Inspection With Projection Electr... Apparatus And Method For Electron Beam Inspection With Projection Electr... Apparatus And Method For Electron Beam Inspection With Projection Electr... |
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9/12/2006 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
11488734 20070047800 8111902 |
Method And Apparatus For Inspecting Defects Of Circuit Patterns Method And Apparatus For Inspecting Defects Of Circuit Patterns Method And Apparatus For Inspecting Defects Of Circuit Patterns |
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8/4/2005 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication |
11196255 20060078189 |
Method and apparatus for inspection Method and apparatus for inspection |
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11/3/2004 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
10896895 20050043903 7292327 |
Circuit-pattern Inspection Apparatus Circuit-pattern Inspection Apparatus Circuit-pattern Inspection Apparatus |
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7/2/2004 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
10762091 20040218806 7602962 |
Method Of Classifying Defects Using Multiple Inspection Machines Method Of Classifying Defects Using Multiple Inspection Machines Method Of Classifying Defects Using Multiple Inspection Machines |
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2/19/2004 |
Hitachi High-technologies Corporation |
Assignee |
Application Publication Patent |
10780752 20040170313 7421110 |
Image Processing Unit For Wafer Inspection Tool Image Processing Unit For Wafer Inspection Tool Image Processing Unit For Wafer Inspection Tool |
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2/14/2002 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09988436 20020171051 6657221 |
Image Classification Method, Obervation Method, And Apparatus Thereof Wi... Image Classification Method, Obervation Method, And Apparatus Thereof Wi... Image Classification Method, Obervation Method, And Apparatus Thereof Wi... |
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2/5/2002 |
Hitachi, Ltd. |
Assignee |
Application Publication |
10062666 20070131877 |
Pattern inspection method and system therefor Pattern inspection method and system therefor |
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2/5/2002 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
10062632 20030007677 7269280 |
Method And Its Apparatus For Inspecting A Pattern Method And Its Apparatus For Inspecting A Pattern Method And Its Apparatus For Inspecting A Pattern |
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11/9/2001 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09986577 20020057831 7266235 |
Pattern Inspection Method And Apparatus Pattern Inspection Method And Apparatus Pattern Inspection Method And Apparatus |
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11/8/2001 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09986299 20020054703 7133550 |
Pattern Inspection Method And Apparatus Pattern Inspection Method And Apparatus Pattern Inspection Method And Apparatus |
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10/31/2001 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09908713 20020030166 6614022 |
Pattern Inspection Method And Apparatus Using Electron Beam Pattern Inspection Method And Apparatus Using Electron Beam Pattern Inspection Method And Apparatus Using Electron Beam |
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2/28/2001 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09793922 20010033683 7116816 |
Method Of Inspecting A Pattern And An Apparatus Thereof And A Method Of ... Method Of Inspecting A Pattern And An Apparatus Thereof And A Method Of ... Method Of Inspecting A Pattern And An Apparatus Thereof And A Method Of ... |
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2/22/2001 |
Hitachi, Ltd. |
Assignee |
Application Publication Patent |
09791911 20020114506 6898305 |
Circuit Pattern Inspection Method And Apparatus Circuit Pattern Inspection Method And Apparatus Circuit Pattern Inspection Method And Apparatus |
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4/6/2000 |
Hitachi, Ltd. |
Assignee |
Application Patent |
09450856 6476913 |
Inspection Method, Apparatus And System For Circuit Pattern Inspection Method, Apparatus And System For Circuit Pattern |
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4/1/1999 |
Hitachi, Ltd. |
Assignee |
Application Patent |
09258461 6335532 |
Convergent Charged Particle Beam Apparatus And Inspection Method Using S... Convergent Charged Particle Beam Apparatus And Inspection Method Using S... |
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1/6/1999 |
Hitachi Ltd. |
Assignee |
Application Patent |
09225512 6614923 |
Pattern Inspecting Method And Apparatus Thereof, And Pattern Inspecting ... Pattern Inspecting Method And Apparatus Thereof, And Pattern Inspecting ... |
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11/16/1998 |
Hitachi Ltd |
Assignee |
Application Patent |
09081636 6087673 |
Method Of Inspecting Pattern And Apparatus Thereof Method Of Inspecting Pattern And Apparatus Thereof |
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9/16/1998 |
Hitachi, Ltd. |
Assignee |
Application Patent |
09132220 6107637 |
Electron Beam Exposure Or System Inspection Or Measurement Apparatus And... Electron Beam Exposure Or System Inspection Or Measurement Apparatus And... |
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12/10/1997 |
Hitachi, Ltd. |
Assignee |
Application Patent |
08811511 6172363 |
Method And Apparatus For Inspecting Integrated Circuit Pattern Method And Apparatus For Inspecting Integrated Circuit Pattern |
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9/17/1997 |
Hitachi, Ltd. |
Assignee |
Application Patent |
08932193 6347150 |
Method And System For Inspecting A Pattern Method And System For Inspecting A Pattern |
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3/26/1997 |
Hitachi Ltd. |
Assignee |
Application Patent |
08824413 5986263 |
Electron Beam Inspection Method And Apparatus And Semiconductor Manufact... Electron Beam Inspection Method And Apparatus And Semiconductor Manufact... |
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2/2/1993 |
Hitachi, Ltd. |
Assignee |
Application Patent |
08012468 5430548 |
Method And Apparatus For Pattern Detection Method And Apparatus For Pattern Detection |
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5/27/1992 |
Hitachi, Ltd |
Assignee |
Application Patent |
07888494 5649022 |
Pattern Checking Method And Checking Apparatus Pattern Checking Method And Checking Apparatus |
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9/1/1989 |
Hitachi, Ltd. |
Assignee |
Application Patent |
07393936 5157735 |
Chipping Detection System And Method Chipping Detection System And Method |
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3/29/1988 |
Hitachi Ltd. |
Assignee |
Application Patent |
06875974 4772125 |
Apparatus And Method For Inspecting Soldered Portions Apparatus And Method For Inspecting Soldered Portions |
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