Johnson, Kenneth C. Litigation, Intellectual Property, Attorneys, SEC Filings, and Other Public Records

Federal Dockets	25
State Dockets	4
Active	1980–2014
Patent Assignments	28

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Date Recorded	Party	Role	Document Type	Document No.	Invention Title

9/3/2004	Kla-tencor Technologies Corporation	Assignee	Application Patent	09298007 6734968	System For Analyzing Surface Characteristics With Self-calibrating Capab... System For Analyzing Surface Characteristics With Self-calibrating Capab...

5/24/2004	Therma-wave Inc.	Assignee	Application Publication Patent	10764792 20040176928 7069153	Cd Metrology Method Cd Metrology Method Cd Metrology Method

10/6/2003	Therma-wave, Inc.	Assignee	Application Publication Patent	10611298 20040032582 6947135	Reduced Multicubic Database Interpolation Method For Optical Measurement... Reduced Multicubic Database Interpolation Method For Optical Measurement... Reduced Multicubic Database Interpolation Method For Optical Measurement...

4/22/2002	Therma-wave, Inc.	Assignee	Application Publication Patent	10074561 20020158193 6819426	Overlay Alignment Metrology Using Diffraction Gratings Overlay Alignment Metrology Using Diffraction Gratings Overlay Alignment Metrology Using Diffraction Gratings

4/22/2002	Therma-wave, Inc.	Assignee	Application Publication Patent	10081078 20020126277 7099081	Small-spot Spectrometry Instrument With Reduced Polarization And Multipl... Small-spot Spectrometry Instrument With Reduced Polarization And Multipl... Small-spot Spectrometry Instrument With Reduced Polarization And Multipl...

2/8/2002	Sensys Instruments Corporation	Assignee	Application Publication Patent	09999410 20020090743 6623991	Method Of Measuring Meso-scale Structures On Wafers Method Of Measuring Meso-scale Structures On Wafers Method Of Measuring Meso-scale Structures On Wafers

1/4/2002	Sensys Instruments Corporation	Assignee	Application Patent	09956356 6753961	Spectroscopic Ellipsometer Without Rotating Components Spectroscopic Ellipsometer Without Rotating Components

10/15/2001	Sensys Instruments Corporation	Assignee	Application Patent	09938415 6850333	Optimized Aperture Shape For Optical Cd/profile Metrology Optimized Aperture Shape For Optical Cd/profile Metrology

10/15/2001	Sensys Instruments Corporation	Assignee	Application Publication Patent	09927177 20020038196 6768967	Database Interpolation Method For Optical Measurement Of Diffractive Mic... Database Interpolation Method For Optical Measurement Of Diffractive Mic... Database Interpolation Method For Optical Measurement Of Diffractive Mic...

10/15/2001	Sensys Instruments Corporation	Assignee	Application Publication Patent	09932548 20020021441 6667805	Small-spot Spectrometry Instrument With Reduced Polarization Small-spot Spectrometry Instrument With Reduced Polarization Small-spot Spectrometry Instrument With Reduced Polarization

2/12/2001	Sensys Intruments Corporation	Assignee	Application Patent	09735286 6340602	Method of measuring meso-scale structures on wafers Method of measuring meso-scale structures on wafers

9/24/1999	Kla-tencor Corporation	Assignee	Application Patent	09405716 6804003	System For Analyzing Surface Characteristics With Self-calibrating Capab... System For Analyzing Surface Characteristics With Self-calibrating Capab...

4/27/1999	Littell International, Inc.	Assignee	Application Publication Patent	09251974 20010002567 6360643	Blade Assembly For Shear Blade Assembly For Shear Blade Assembly For Shear

4/26/1999	Littel International, Inc.	Assignee	Application Patent	09247708 6161460	Bearing Assembly For Shear Bearing Assembly For Shear

2/13/1998	Littell International, Inc.	Assignee	Application Patent	08901351 5951889	System And Method For Laser Welding System And Method For Laser Welding

2/13/1998	Littell International, Inc.	Assignee	Application Patent	08901991 5932117	Clamping System For Sheet Material In A Welding System Clamping System For Sheet Material In A Welding System

2/13/1998	Littell International, Inc.	Assignee	Application Patent	08901685 5926967	System For Gauging The Position Of Joint Edges For Welding System For Gauging The Position Of Joint Edges For Welding

2/13/1998	Littell International, Inc.	Assignee	Application Patent	08902126 6070781	System For Bringing The Joint Edges Of Sheet Material Into Butting Relat... System For Bringing The Joint Edges Of Sheet Material Into Butting Relat...

9/29/1997	Tencor Instruments	Assignee	Application Patent	08835533 5859424	Apodizing Filter System Useful For Reducing Spot Size In Optical Measure... Apodizing Filter System Useful For Reducing Spot Size In Optical Measure...

5/19/1997	Littell International, Inc.	Assignee	Application Patent	08696132 5901627	Apparatus And Method For Shearing Material Apparatus And Method For Shearing Material

10/15/1996	Littel International, Inc.	Assignee	Application Patent	08696132 5901627	Apparatus And Method For Shearing Material Apparatus And Method For Shearing Material

2/22/1996	Littell Int'l., Inc.	Assignee	Application Patent	08554372 5814786	System And Method For Laser Butt-welding System And Method For Laser Butt-welding

3/1/1984	F. J. Littell Machine Company	Assignee	Application Patent	06585187 4559900	Device For Coating Strip Material Device For Coating Strip Material

5/13/1983	International Computers Ltd.	Assignee	Application Patent	06420272 4523192	Data Processing Network Data Processing Network

5/9/1983	International Computers Ltd.	Assignee	Application Patent	06324432 4419638	Negative Resistance Element Negative Resistance Element

4/1/1983	International Computers Ltd.	Assignee	Application Patent	06481582 4596937	Digital Phase-locked Loop Digital Phase-locked Loop

11/23/1981	International Computers Ltd.	Assignee	Application Patent	06323801 4413227	Negative Resistance Element Negative Resistance Element

6/3/1981	Hughes Aircraft Company	Assignee	Application Patent	06270159 4372639	Directional Diffusing Screen Directional Diffusing Screen

28 Rows Total

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