Kla-Tencor
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5/12/2009 |
Superior Court of California, County of Santa Clara |
2009-1-CV-142232 |
R. Murphy v. KLA-Tencor, et al |
Defendant |
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5/6/2009 |
Superior Court of California, County of Santa Clara |
2009-1-CV-141785 |
R. Murphy v. KLA-TENCOR, et al |
Defendant |
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11/18/2008 |
Superior Court of California, County of Santa Clara |
2008-1-CV-127901 |
W. Bell, et al v. American Medical & Equipment Supply, Inc. |
Claimant |
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7/15/2003 |
Arizona District Court |
2:03-cv-01348-SRB |
Crump, et al v. KLA-Tencor |
Defendant |
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11/1/2002 |
Superior Court of California, County of Santa Clara |
2002-1-CV-812395 |
KLA TENCOR v. KLA-TENCOR |
Subpoenaed Party |
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8/3/2001 |
Superior Court of California, County of Santa Clara |
2001-1-CV-800441 |
LINCH v. KLA-TENCOR |
Defendant |
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Inside Counsel (0)
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Outside Counsel (9)
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GLOBA |
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Heslin Rothenberg Farley & Mesiti, PC |
Albany, NY |
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Field |
Jennifer |
L. |
Baker & McKenzie, LLP |
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Freeman |
Kerry |
McInerney |
Miller Law Group PC |
Ca, |
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Hoellwarth |
Quin |
C. |
Beyer Weaver & Thomas, LLP |
Mountain View, CA |
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Hutchins |
Suzanne |
Sordello |
Baker & McKenzie, LLP |
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Lee |
Phillip |
P. |
Beyer Weaver & Thomas, LLP |
Berkeley, CA |
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Olynick |
Mary |
R. |
Beyer & Weaver LLP |
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Olynick |
Mary |
Ramos |
Beyer Weaver & Thomas, LLP |
Berkeley, CA |
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Olynick |
Mary |
R. |
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Oakland, CA |
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2/2/2018 |
Zhao, Qiang |
Assignor |
Application
Publication |
15887357
20190242938 |
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2/2/2018 |
Hu, Dawei |
Assignor |
Application
Publication |
15887357
20190242938 |
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2/2/2018 |
Di, Ming |
Assignor |
Application
Publication |
15887357
20190242938 |
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3/30/2010 |
Goldberg, Edward M. |
Assignor |
Application
Publication
Patent |
11462644
20060269119
7724939 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
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3/30/2010 |
Johnson, Erik N. |
Assignor |
Application
Publication
Patent |
11462644
20060269119
7724939 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
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3/30/2010 |
Miller, Lawrence R. |
Assignor |
Application
Publication
Patent |
11462644
20060269119
7724939 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
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12/14/2009 |
Satya, Akella V.s. |
Assignor |
Application
Publication
Patent |
11621512
20070111342
7655482 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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12/14/2009 |
Pinto, Gustavo A. |
Assignor |
Application
Publication
Patent |
11621512
20070111342
7655482 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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12/14/2009 |
Mantalas, Lynda C. |
Assignor |
Application
Publication
Patent |
11621512
20070111342
7655482 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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12/3/2008 |
Kvamme, Damon F. |
Assignor |
Application
Publication
Patent |
11830790
20080018883
7486393 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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12/3/2008 |
Walsh, Robert W. |
Assignor |
Application
Publication
Patent |
11830790
20080018883
7486393 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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6/13/2001 |
Mcghee, Ridge C. |
Assignor |
Application
Patent |
09881451
6581193 |
Apparatus And Methods For Modeling Process Effects And Imaging Effects I...
Apparatus And Methods For Modeling Process Effects And Imaging Effects I... |
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6/13/2001 |
Ananthanarayanan, Mohan |
Assignor |
Application
Patent |
09881451
6581193 |
Apparatus And Methods For Modeling Process Effects And Imaging Effects I...
Apparatus And Methods For Modeling Process Effects And Imaging Effects I... |
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6/13/2001 |
Watts, Robert A. |
Assignor |
Application
Patent |
09881451
6581193 |
Apparatus And Methods For Modeling Process Effects And Imaging Effects I...
Apparatus And Methods For Modeling Process Effects And Imaging Effects I... |
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12/12/2000 |
Kvamme, Damon F. |
Assignor |
Application
Patent |
09636124
6879390 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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12/12/2000 |
Walsh, Robert W. |
Assignor |
Application
Patent |
09636124
6879390 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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12/11/2000 |
Kvamme, Damon F. |
Assignor |
Application
Patent |
09636129
6636301 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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12/11/2000 |
Walsh, Robert W. |
Assignor |
Application
Patent |
09636129
6636301 |
Multiple Beam Inspection Apparatus And Method
Multiple Beam Inspection Apparatus And Method |
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11/24/2000 |
Veneklasen, Lee |
Assignor |
Application
Patent |
09579867
6586733 |
Apparatus And Methods For Secondary Electron Emission Microscope With Du...
Apparatus And Methods For Secondary Electron Emission Microscope With Du... |
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11/24/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09579867
6586733 |
Apparatus And Methods For Secondary Electron Emission Microscope With Du...
Apparatus And Methods For Secondary Electron Emission Microscope With Du... |
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11/6/2000 |
Mccord, Mark A. |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
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11/6/2000 |
Lauber, Jan |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
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11/6/2000 |
Pei, Jun |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
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11/6/2000 |
Fernandez, Jorge P. |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
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10/13/2000 |
Shafer, David |
Assignor |
Application
Patent |
09602920
6362923 |
Lens for microscopic inspection
Lens for microscopic inspection |
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10/13/2000 |
Lange, Steven R. |
Assignor |
Application
Patent |
09602920
6362923 |
Lens for microscopic inspection
Lens for microscopic inspection |
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10/10/2000 |
Bareket, Noah |
Assignor |
Application
Patent |
09603120
6462818 |
Overlay Alignment Mark Design
Overlay Alignment Mark Design |
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8/28/2000 |
Satya Akella V.s. |
Assignor |
Application
Patent |
09648096
6433561 |
Methods And Apparatus For Optimizing Semiconductor Inspection Tools
Methods And Apparatus For Optimizing Semiconductor Inspection Tools |
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8/28/2000 |
Leslie, Brian C. |
Assignor |
Application
Patent |
09648096
6433561 |
Methods And Apparatus For Optimizing Semiconductor Inspection Tools
Methods And Apparatus For Optimizing Semiconductor Inspection Tools |
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8/28/2000 |
Tsai, Bin-ming Benjamin |
Assignor |
Application
Patent |
09648096
6433561 |
Methods And Apparatus For Optimizing Semiconductor Inspection Tools
Methods And Apparatus For Optimizing Semiconductor Inspection Tools |
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8/28/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648096
6433561 |
Methods And Apparatus For Optimizing Semiconductor Inspection Tools
Methods And Apparatus For Optimizing Semiconductor Inspection Tools |
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8/28/2000 |
Long, Robert Thomas |
Assignor |
Application
Patent |
09648096
6433561 |
Methods And Apparatus For Optimizing Semiconductor Inspection Tools
Methods And Apparatus For Optimizing Semiconductor Inspection Tools |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648212
6509197 |
Inspectable Buried Test Structures And Methods For Inspecting The Same
Inspectable Buried Test Structures And Methods For Inspecting The Same |
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8/25/2000 |
Richardson, Neil |
Assignor |
Application
Patent |
09648212
6509197 |
Inspectable Buried Test Structures And Methods For Inspecting The Same
Inspectable Buried Test Structures And Methods For Inspecting The Same |
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8/25/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648212
6509197 |
Inspectable Buried Test Structures And Methods For Inspecting The Same
Inspectable Buried Test Structures And Methods For Inspecting The Same |
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8/25/2000 |
Long, Robert Thomas |
Assignor |
Application
Patent |
09648212
6509197 |
Inspectable Buried Test Structures And Methods For Inspecting The Same
Inspectable Buried Test Structures And Methods For Inspecting The Same |
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8/25/2000 |
Mantalas, Lynda C. |
Assignor |
Application
Patent |
09648212
6509197 |
Inspectable Buried Test Structures And Methods For Inspecting The Same
Inspectable Buried Test Structures And Methods For Inspecting The Same |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648094
6524873 |
Continuous Movement Scans Of Test Structures On Semiconductor Integrated...
Continuous Movement Scans Of Test Structures On Semiconductor Integrated... |
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8/25/2000 |
Walker, David J. |
Assignor |
Application
Patent |
09648094
6524873 |
Continuous Movement Scans Of Test Structures On Semiconductor Integrated...
Continuous Movement Scans Of Test Structures On Semiconductor Integrated... |
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8/25/2000 |
Richardson, Neil |
Assignor |
Application
Patent |
09648094
6524873 |
Continuous Movement Scans Of Test Structures On Semiconductor Integrated...
Continuous Movement Scans Of Test Structures On Semiconductor Integrated... |
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8/25/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09648094
6524873 |
Continuous Movement Scans Of Test Structures On Semiconductor Integrated...
Continuous Movement Scans Of Test Structures On Semiconductor Integrated... |
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8/25/2000 |
Tsai, Bin-ming Benjamin |
Assignor |
Application
Patent |
09648094
6524873 |
Continuous Movement Scans Of Test Structures On Semiconductor Integrated...
Continuous Movement Scans Of Test Structures On Semiconductor Integrated... |
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8/25/2000 |
Satya, Akella V. S. |
Assignor |
Application
Patent |
09648095
7179661 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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8/25/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648095
7179661 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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8/25/2000 |
Mantalas, Lynda C. |
Assignor |
Application
Patent |
09648095
7179661 |
Chemical Mechanical Polishing Test Structures And Methods For Inspecting...
Chemical Mechanical Polishing Test Structures And Methods For Inspecting... |
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8/25/2000 |
Walker, David J. |
Assignor |
Application
Patent |
09648092
6636064 |
Dual Probe Test Structures For Semiconductor Integrated Circuits
Dual Probe Test Structures For Semiconductor Integrated Circuits |
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8/25/2000 |
Richardson, Neil |
Assignor |
Application
Patent |
09648092
6636064 |
Dual Probe Test Structures For Semiconductor Integrated Circuits
Dual Probe Test Structures For Semiconductor Integrated Circuits |
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8/25/2000 |
Weiner, Kurt H. |
Assignor |
Application
Patent |
09648092
6636064 |
Dual Probe Test Structures For Semiconductor Integrated Circuits
Dual Probe Test Structures For Semiconductor Integrated Circuits |
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8/25/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09648092
6636064 |
Dual Probe Test Structures For Semiconductor Integrated Circuits
Dual Probe Test Structures For Semiconductor Integrated Circuits |
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8/25/2000 |
Satya, Akella |
Assignor |
Application
Patent |
09648092
6636064 |
Dual Probe Test Structures For Semiconductor Integrated Circuits
Dual Probe Test Structures For Semiconductor Integrated Circuits |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648093
6633174 |
Stepper Type Test Structures And Methods For Inspection Of Semiconductor...
Stepper Type Test Structures And Methods For Inspection Of Semiconductor... |
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8/25/2000 |
Walker, David J. |
Assignor |
Application
Patent |
09648093
6633174 |
Stepper Type Test Structures And Methods For Inspection Of Semiconductor...
Stepper Type Test Structures And Methods For Inspection Of Semiconductor... |
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8/25/2000 |
Richardson, Neil |
Assignor |
Application
Patent |
09648093
6633174 |
Stepper Type Test Structures And Methods For Inspection Of Semiconductor...
Stepper Type Test Structures And Methods For Inspection Of Semiconductor... |
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8/25/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09648093
6633174 |
Stepper Type Test Structures And Methods For Inspection Of Semiconductor...
Stepper Type Test Structures And Methods For Inspection Of Semiconductor... |
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8/25/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648093
6633174 |
Stepper Type Test Structures And Methods For Inspection Of Semiconductor...
Stepper Type Test Structures And Methods For Inspection Of Semiconductor... |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Leslie, Brian C. |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Tsai, Bin-ming Benjamin |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Long, Robert Thomas |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Richardon, Neil |
Assignor |
Application
Patent |
09648379
6445199 |
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast...
Methods And Apparatus For Generating Spatially Resolved Voltage Contrast... |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648381
6771806 |
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro...
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro... |
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8/25/2000 |
Walker, David J. |
Assignor |
Application
Patent |
09648381
6771806 |
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro...
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro... |
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8/25/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09648381
6771806 |
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro...
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro... |
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8/25/2000 |
Tsai, Bin-ming Benjamin |
Assignor |
Application
Patent |
09648381
6771806 |
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro...
Multi-pixel Methods And Apparatus For Analysis Of Defect Information Fro... |
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8/25/2000 |
Satya, Akella V.s. |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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8/25/2000 |
Walker, David J. |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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8/25/2000 |
Leslie, Brian C. |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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8/25/2000 |
Adler, David L. |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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8/25/2000 |
Pinto, Gustavo A. |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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8/25/2000 |
Long, Robert Thomas |
Assignor |
Application
Patent |
09648109
6566885 |
Multiple Directional Scans Of Test Structures On Semiconductor Integrate...
Multiple Directional Scans Of Test Structures On Semiconductor Integrate... |
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|
6/26/2000 |
Mccord, Mark A. |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
|
|
|
6/26/2000 |
Lauber, Jan |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
|
|
|
6/26/2000 |
Pei, Jun |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
|
|
|
6/26/2000 |
Fernandez, Jorge P. |
Assignor |
Application
Patent |
09502554
6664546 |
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base...
In-situ Probe For Optimizing Electron Beam Inspection And Metrology Base... |
|
|
|
4/24/2000 |
Nikoonahad, Mehrdad |
Assignor |
Application
Patent |
09556238
6671051 |
Apparatus And Methods For Detecting Killer Particles During Chemical Mec...
Apparatus And Methods For Detecting Killer Particles During Chemical Mec... |
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4/24/2000 |
Sethuraman, Anantha R. |
Assignor |
Application
Patent |
09556238
6671051 |
Apparatus And Methods For Detecting Killer Particles During Chemical Mec...
Apparatus And Methods For Detecting Killer Particles During Chemical Mec... |
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4/24/2000 |
Zhao, Guoheng |
Assignor |
Application
Patent |
09556238
6671051 |
Apparatus And Methods For Detecting Killer Particles During Chemical Mec...
Apparatus And Methods For Detecting Killer Particles During Chemical Mec... |
|
|
|
11/24/1999 |
Goldberg, Edward M. |
Assignor |
Application
Patent |
09449022
7106895 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
|
|
|
11/24/1999 |
Johnson, Erik N. |
Assignor |
Application
Patent |
09449022
7106895 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
|
|
|
11/24/1999 |
Miller, Lawrence R., Md, Phd |
Assignor |
Application
Patent |
09449022
7106895 |
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce...
Method And Apparatus For Inspecting Reticles Implementing Parallel Proce... |
|
|
|
9/15/1999 |
Kele, Kalman |
Assignor |
Application
Patent |
09396143
6628397 |
Apparatus And Methods For Performing Self-clearing Optical Measurements
Apparatus And Methods For Performing Self-clearing Optical Measurements |
|
|
|
9/15/1999 |
Nikoonahad, Mehrdad |
Assignor |
Application
Patent |
09396143
6628397 |
Apparatus And Methods For Performing Self-clearing Optical Measurements
Apparatus And Methods For Performing Self-clearing Optical Measurements |
|
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|
9/15/1999 |
Zhao, Guoheng |
Assignor |
Application
Patent |
09396143
6628397 |
Apparatus And Methods For Performing Self-clearing Optical Measurements
Apparatus And Methods For Performing Self-clearing Optical Measurements |
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9/15/1999 |
Lee, Shing M. |
Assignor |
Application
Patent |
09396143
6628397 |
Apparatus And Methods For Performing Self-clearing Optical Measurements
Apparatus And Methods For Performing Self-clearing Optical Measurements |
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9/15/1999 |
Lehman, Kurt R. |
Assignor |
Application
Patent |
09396143
6628397 |
Apparatus And Methods For Performing Self-clearing Optical Measurements
Apparatus And Methods For Performing Self-clearing Optical Measurements |
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5/3/1999 |
Ye, Jun |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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5/3/1999 |
Wiley, James N. |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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5/3/1999 |
Alles, David S. |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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5/3/1999 |
Juang, Shauh-teh |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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5/3/1999 |
Lu, Yen-wen |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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5/3/1999 |
Cao, Yu |
Assignor |
Application
Patent |
09304437
6516085 |
Apparatus And Methods For Collecting Global Data During A Reticle Inspec...
Apparatus And Methods For Collecting Global Data During A Reticle Inspec... |
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3/8/1999 |
Glasser, Lance A. |
Assignor |
Application
Patent |
09213744
6529621 |
Mechanisms For Making And Inspecting Reticles
Mechanisms For Making And Inspecting Reticles |
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3/8/1999 |
Ye, Jun |
Assignor |
Application
Patent |
09213744
6529621 |
Mechanisms For Making And Inspecting Reticles
Mechanisms For Making And Inspecting Reticles |
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3/8/1999 |
Wiley, James N. |
Assignor |
Application
Patent |
09213744
6529621 |
Mechanisms For Making And Inspecting Reticles
Mechanisms For Making And Inspecting Reticles |
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3/8/1999 |
Alles, David S. |
Assignor |
Application
Patent |
09213744
6529621 |
Mechanisms For Making And Inspecting Reticles
Mechanisms For Making And Inspecting Reticles |
|
|
|
3/8/1999 |
Juang, Shauh-teh |
Assignor |
Application
Patent |
09213744
6529621 |
Mechanisms For Making And Inspecting Reticles
Mechanisms For Making And Inspecting Reticles |
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|
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9/8/1998 |
Concina, Stefano E. |
Assignor |
Application
Patent |
09149767
6066849 |
Scanning Electron Beam Microscope
Scanning Electron Beam Microscope |
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|
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9/8/1998 |
Adler, David L. |
Assignor |
Application
Patent |
09149767
6066849 |
Scanning Electron Beam Microscope
Scanning Electron Beam Microscope |
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|
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9/8/1998 |
Masnaghetti, Douglas K. |
Assignor |
Application
Patent |
09149767
6066849 |
Scanning Electron Beam Microscope
Scanning Electron Beam Microscope |
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|
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9/8/1998 |
Sun, Stanley S. |
Assignor |
Application
Patent |
09149767
6066849 |
Scanning Electron Beam Microscope
Scanning Electron Beam Microscope |
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|
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9/8/1998 |
Ng, Waiman |
Assignor |
Application
Patent |
09149767
6066849 |
Scanning Electron Beam Microscope
Scanning Electron Beam Microscope |
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