Nakagaki, Ryo
United States
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Nakagaki, Ryo
Profile Timeline Documents (0) Litigation (5) Attorneys (202) Stock Market (0) Related (0) Patent Assignments (57) Trademark Assignments (0) Payments (0)
Federal Dockets
5
Active
1999–2004
Patent Assignments
57
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Outside Counsel (202)
, Megan E. Bussey Kilpatrick Townsend & Stockton, LLP Ny 10036,
Adams Scott Davis Wright Tremaine LLP Seattle, WA
ALBERT PHILIP Kilpatrick Townsend & Stockton, LLP
Alemanni John C Kilpatrick Townsend & Stockton, LLP Winston-salem, Nc,
Allen Kenneth Steuart St., Tower, One Market Plaza San Fra... Virginia Beach, VA
Aly Amr O Jenner & Block, LLP
Amanat Houtan Kilpatrick Townsend & Stockton, LLP
Annis David C. Kilpatrick Townsend & Stockton, LLP
Antonelli Donald R. STOUT & KRAUS Washington, DC
Apple Randolph Ted Kilpatrick Townsend & Stockton, LLP
Artuz Robert J. Kilpatrick Townsend & Stockton, LLP
Barrish Mark Kilpatrick Townsend & Stockton, LLP
Basarkar Girish Sharp Kabushiki Kaisha
BASTIAN KEVIN Townsend & Townsend & Crew LLP San Francisco, CA
Belagodu Akarsh P. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Bergstrom James T. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Bernard Eugene L. Bernard, Rothwell & Brown, PC Washington, DC
Bertelson Michael A. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Blackburn Jennifer Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Blake Vanessa M. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Boring Landin F. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Boyd David W. Kilpatrick Townsend & Stockton, LLP San Francisco, CA
Britt Juliene Kilpatrick Townsend & Stockton, LLP SEATTLE, WA
Brown Kyle A. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Brown Theodore Fay Sharpe LLP
BRUNDIDGE CARL Brundidge & Stanger, P.C. ALEXANDRIA, VA
Calkins Charles Paul Hastings LLP FT. BELVOIR, DC
Cassell Nathan ARVADA, CO
Caswell Deborah Hickman Palermo Truong & Becker, LLP
Catmull Kelvin B. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
CHANG KO-FANG Townsend & Townsend & Crew LLP
CHOI WENDY Rohm And Haas Company PHILADELPHIA, PA
COLWELL ROBERT Kilpatrick Townsend & Stockton, LLP
Colwell Robert PAUL J. WINTERS
Cook Roger Lee Kilpatrick Townsend & Stockton, LLP San Francisco, CA
Cooklin Kristin M. Kilpatrick Townsend & Stockton, LLP Washington, DC
Cosenza Martin II Hauptman Ham, LLP
CRALL KRISTIN Kilpatrick Townsend & Stockton, LLP ATLANTA, GA
Cretsinger Cathy E. Kilpatrick Townsend & Stockton, LLP
Curylo Robert J. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Dailey Robert Kilpatrick Townsend & Stockton, LLP Washington, DC
Daley William Sharp Kabushiki Kaisha Minneapolis, MN
Dimino Michael Reveo, Inc. SAVANNAH, GA
Dodson Richard P. Kilpatrick Townsend & Stockton, LLP ATLANTA, GA
Doyle Kristin Johnson Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Dresser James M. Antonelli, Terry, Stout & Kraus, LLP
Dresser James ALAN E. SCHIAVELLI
Durkee Christopher M. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Ellenberger Ernest L. Womble Carlyle Sandridge & Rice, LLP CUPERTINO, CA
Eng Hugo Hoffman-La Roche, Inc.
Esq. Melvin Kraus Antonelli, Terry, Stout & Kraus, LLP
Eurek Justin J. Kilpatrick Townsend & Stockton, LLP SAN FRANCISCO, CA
Ewing James Lindsay Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Ferrario Matias Kilpatrick Townsend & Stockton, LLP Winston-salem, Nc,
Flanagan Lisa Kilpatrick Townsend & Stockton, LLP
Foster Bryan Stuart Kilpatrick Townsend & Stockton, LLP Winston-salem, Nc,
Franklin Thomas D. Kilpatrick Townsend & Stockton, LLP DENVER, CO
Gao Chuan Kilpatrick Townsend & Stockton, LLP San Francisco, CA
Gardner Jason Kilpatrick Townsend & Stockton, LLP Atlanta, GA
GARDNER JOHN STEVEN WINSTON-SALEM, NC
Garrett-Wackowski Euginia Kilpatrick Townsend & Stockton, LLP
Gaudry Katherine S. Kilpatrick Townsend & Stockton, LLP
Gavin Geoffrey Kilpatrick Townsend & Stockton, LLP
Gee Tyler Kilpatrick Townsend & Stockton, LLP
Ghazanfari Faryar Kilpatrick Townsend & Stockton, LLP
Gibby Darin J. Townsend & Townsend & Crew LLP
Gibson Donald Fernandez & Associates, LLP
Giordano-Coltart Jennifer Paul Hastings LLP
Golladay James II Kilpatrick Townsend & Stockton, LLP Ca,
Grab Leslie Kilpatrick Townsend & Stockton, LLP Winston-salem, Nc,
Graham Jamie L. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Grant Bonnie Marie Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Gray Charles Kilpatrick Townsend & Stockton, LLP
Gray Gerald Todd Leydig Voit & Mayer, Ltd. Walnut Creek, CA
Gressler Donna Foley & Lardner, LLP
Hall David Baker Donelson Bearman Caldwell & Berkowitz,... Los Angeles, CA
Hao Joe C. Kilpatrick Townsend & Stockton, LLP SAN FRANCISCO, CA
Hart Catherine E. Kilpatrick Townsend & Stockton, LLP
HAUGHEY PAUL Kilpatrick Townsend & Stockton, LLP
Heines M. Henry Townsend & Townsend & Crew LLP San Francisco, CA
Henderson Mymy Kilpatrick Townsend & Stockton, LLP
Hetzer-egger Claudia Kilpatrick Townsend & Stockton, LLP SAN DIEGO, CA
Hinsch. Matthew Kilpatrick Townsend & Stockton, LLP SAN FRANCISCO, CA
Hokamura Aaron Kilpatrick Townsend & Stockton, LLP
HOLLOWAY DAVID CLAY Kilpatrick Townsend & Stockton, LLP Atlanta, GA
HOLMES BRENDA Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Holt Benjamin Kilpatrick Townsend & Stockton, LLP
Hopkins Mark H. Kilpatrick Townsend & Stockton, LLP
Howard James Paul Hastings LLP
Hsueh Hain-Whei Kilpatrick Townsend & Stockton, LLP
Hylton Roger Kilpatrick Townsend & Stockton, LLP
III Alton Absher , Kilpatrick Townsend & Stockton, LLP Winston-salem, Nc,
Jenkins Kenneth E. Kilpatrick Townsend & Stockton, LLP
Jensen Philip DLA Piper (US) LLP EAST PALO ALTO, CA
Jewett Stephen E. Kilpatrick Townsend & Stockton, LLP
Jewik Patrick K. Leydig Voit & Mayer, Ltd. Washington, DC
Johns Athena Sharp Kabushiki Kaisha
Johns. Carol Kilpatrick Townsend & Stockton, LLP
Joswick Eugene B. Kilpatrick Townsend & Stockton, LLP Atlanta, GA
Kadaba Vaibhav Kilpatrick Townsend & Stockton, LLP Atlanta, GA
6/29/2015 Hitachi High-technologies Corporation Assignee Application 14652198 Defect Observation Method And Defect Observation Device
6/29/2015 Hitachi High-technologies Corporation Assignee Application 14652198 Defect Observation Method And Defect Observation Device
6/9/2015 Hitachi High-technologies Corporation Assignee Application 14650515 Defect Observation Method and Defect Observation Device
6/9/2015 Hitachi High-technologies Corporation Assignee Application 14650515 Defect Observation Method and Defect Observation Device
4/7/2015 Hitachi High-technologies Corporation Assignee Application 14433891 Surface Conditioning Composition, Method For Producing The Same, And Sur...
4/7/2015 Hitachi High-technologies Corporation Assignee Application 14433891 Charged-Particle Radiation Apparatus
3/13/2015 Hitachi High-technologies Corporation Assignee Application 14400341 Defect Analysis Assistance Device, Program Executed By Defect Analysis A...
3/13/2015 Hitachi High-technologies Corporation Assignee Application 14400341 Defect Analysis Assistance Device, Program Executed By Defect Analysis A...
10/15/2014 Hitachi High-technologies Corporation Assignee Application 14391671 Charged Particle Beam Apparatus
7/14/2014 Hitachi High-technologies Corporation Assignee Application 14370727 Method For Measuring Overlay And Measuring Apparatus, Scanning Electron ...
7/14/2014 Hitachi High-technologies Corporation Assignee Application 14370727 Method For Measuring Overlay And Measuring Apparatus, Scanning Electron ...
5/27/2014 Hitachi High-technologies Corporation Assignee Application 14360636 Gui, Classification Apparatus, Classification Method, Program, And Stora...
5/27/2014 Hitachi High-technologies Corporation Assignee Application 14360636 Gui, Classification Apparatus, Classification Method, Program, And Stora...
3/26/2014 Hitachi High-technologies Corporation Assignee Application 14347127 Method and Apparatus for Reviewing Defect
2/19/2014 Hitachi High-technologies Corporation Assignee Application 14239653 Region-of-interest Determination Apparatus, Observation Tool Or Inspecti...
2/4/2014 Hitachi High-technologies Corporation Assignee Application 14236887 Recipe Generation Apparatus, Inspection Support Apparatus, Inspection Sy...
11/25/2013 Hitachi High-technologies Corporation Assignee Application 14112105 Defect Classification Method, And Defect Classification System
7/12/2013 Hitachi High-technologies Corporation Assignee Application 13979450 Image Classification Method And Image Classification Apparatus
5/9/2013 Hitachi High-technologies Corporation Assignee Application 13878256 Defect Classification System And Defect Classification Device And Imagin...
12/6/2012 Hitachi High-technologies Corporation Assignee Application 13639103 Web Press And A Method Of Initiating Printing
11/27/2012 Hitachi High-technologies Corporation Assignee Application 13520210 Method And Device For Testing Defect Using Sem
8/6/2012 Hitachi High-technologies Corporation Assignee Application 13515643 Defect Observation Method And Defect Observation Device
6/29/2012 Hitachi High-technologies Corporation Assignee Application 13513258 Method For Defect Inspection And Apparatus For Defect Inspection
8/8/2011 Hitachi High-technologies Corporation Assignee Application 13146032 Defect Observation Method And Defect Observation Apparatus
8/4/2011 Hitachi High-technologies Corporation Assignee Application 13143345 Defect Observation Method And Device Using Sem
7/15/2011 Hitachi High-technologies Corporation Assignee Application 13122160 Defect Observation Device And Defect Observation Method
6/22/2009 Hitachi High-technologies Corporation Assignee Application 12428557 Method And Apparatus For Reviewing Defects
6/1/2009 Hitachi High-technologies Corporation Assignee Application 12416273 Method And Its Apparatus For Reviewing Defects
1/27/2009 Hitachi High-technologies Corporation Assignee Application 12292173 Defect Review Method And Apparatus
5/27/2008 Hitachi High-technologies Corporation Assignee Application 12153852 Method and its apparatus for reviewing defects
5/16/2008 Hitachi High-technologies Corporation Assignee Application 12153333 Method And System For Observing A Specimen Using A Scanning Electron Mic...
7/27/2007 Hitachi High-technologies Corporation Assignee Application 11747253 Sem-type Reviewing Apparatus And A Method For Reviewing Defects Using Th...
5/4/2007 Hitachi High-technologies Corporation Assignee Application 11704350 Defect Classifier Using Classification Recipe Based On Connection Betwee...
7/19/2006 Hitachi High-technologies Corporation Assignee Application 11488636 Method And Apparatus For Reviewing Defects Of Semiconductor Device
3/7/2006 Hitachi High-technologies Corporation Assignee Application 11311254 Method And Apparatus For Reviewing Defects
2/10/2006 Hitachi High-technologies Corporation Assignee Application 11268568 Scanning Electron Microscope And System For Inspecting Semiconductor Dev...
11/23/2005 Hitachi High-technologies Corporation Assignee Application 11119934 Electron Microscope, Measuring Method Using The Same, Electron Microscop...
10/31/2005 Hitachi High-technologies Corporation Assignee Application 11202146 Mesuring Method And Its Apparatus
6/27/2005 Hitachi-technologies Corporation Assignee Application 11119934 Electron Microscope, Measuring Method Using The Same, Electron Microscop...
5/12/2005 Hitachi High-technologies Corporation Assignee Application 11127248 Method For Controlling Charged Particle Beam, And Charged Particle Beam ...
5/12/2005 Hitachi High-technologies Corporation Assignee Application 11127248 Method For Controlling Charged Particle Beam, And Charged Particle Beam ...
4/25/2005 Hitachi High-technologies Corporation Assignee Application 10893275 Method of setting etching parameters and system therefor
2/15/2005 Hitachi High-technologies Corporation Assignee Application 10988522 Scanning Electron Microscope And A Method For Evaluating Accuracy Of Rep...
11/16/2004 Hitachi High-technologies Corporation Assignee Application 10875509 Sample Dimension-measuring Method And Charged Particle Beam Apparatus
9/29/2004 Hitachi High-technologies Corporation Assignee Application 10893275 Method of setting etching parameters and system therefor
8/16/2004 Hitachi High-technologies Corporation Assignee Application 10918340 Transmission Electron Microscope System And Method Of Inspecting A Speci...
4/9/2004 Hitachi, Ltd. Assignee Application 09716077 Defect Image Classifying Method And Apparatus And A Semiconductor Device...
4/8/2004 Hitachi High-technologies Corporation Assignee Application 10699528 Use Of Three-dimensional Test Patterns In The Manufacture Of Semiconduct...
2/2/2004 Hitachi High-technologies Corporation Assignee Application 10648231 System And Method For Evaluating A Semiconductor Device Pattern, Method ...
10/7/2003 Hitachi High-technologies Corporation Assignee Application 10679290 Method For Measuring Three Dimensional Shape Of A Fine Pattern
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